ALEXANDRIA, Va., May 1 -- United States Patent no. 11,971,802, issued on April 30, was assigned to EMC IP Holding Co. LLC (Hopkinton, Mass.).
"Method, electronic device, and computer program product for code defect detection" was invented by Jiacheng Ni (Shanghai), Rong Sheng (Shanghai) and Ke Shan (Shanghai).
According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present disclosure provide a method, an electronic device, and a computer program product for code defect detection. The method described here includes determining log information associated with a defect based on the defect reported during testing of a software product. The method further includes determining a nature of the defect based ...